The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Dec. 28, 2018
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Yi-Cheng Liu, Hsinchu County, TW;

Yuan-Chin Lee, Hsinchu, TW;

De-Yi Chiou, New Taipei, TW;

Hung-Chih Chiang, Chiayi, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 18/24 (2006.01); A61B 5/00 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
A61B 18/24 (2013.01); A61B 5/0084 (2013.01); G02B 27/106 (2013.01);
Abstract

An optical system adapted to detect an object including a beam splitting and combing element, a catheter, a focusing element, a deformation detecting module, and an object detecting module is provided. The catheter sleeves outside an optical fiber, and the optical fiber has at least one fiber Bragg gratings. The deformation detecting module and the object detecting module are coupled to the beam splitting and combing element. A first light is reflected by the at least one fiber Bragg gratings and then transmitted to the deformation detecting module. A second light is transmitted to and reflected by the object, so as to be transmitted to the object detecting module. A first wavelength range of the first light is different from a second wavelength range of the second light.


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