The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jun. 27, 2018
General Electric Company, Schenectady, NY (US);
Franco Rupcich, Wauwatosa, WI (US);
Dominic Crotty, Waukesha, WI (US);
Jiahua Fan, New Berlin, WI (US);
Parag Khobragade, Milwaukee, WI (US);
Tal Gilat Schmidt, Milwaukee, WI (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
Computed tomography (CT) imaging system has at least one processing unit configured to receive operator inputs that include a modified system feature and a clinical task having a task object and also receive operator inputs for determining a task-based image quality (IQ) metric. The task-based IQ metric represents a desired overall image quality of image data for performing the clinical task. The image data acquired using a reference system feature. The at least one processing unit is also configured to determine an exposure-control parameter based on the task object, the modified system feature, and the task-based IQ metric. The at least one processing unit is also configured to direct the x-ray source to generate the x-ray beam during the CT scan, wherein at least one of the tube current or the tube potential during the CT scan is a function of the exposure-control parameter.