The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jun. 09, 2016
Applicant:
The Governing Council of the University of Toronto, Toronto, CA;
Inventors:
Nima Soltani, Toronto, CA;
Roman Genov, Toronto, CA;
Assignee:
THE GOVERNING COUNCIL OF THE UNIVERSITY OF TORONTO, Toronto, CA;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2021.01); A61B 5/1473 (2006.01); A61B 5/00 (2006.01); A61B 5/0536 (2021.01); A61B 5/1477 (2006.01); H03M 3/00 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1473 (2013.01); A61B 5/002 (2013.01); A61B 5/0536 (2013.01); A61B 5/1477 (2013.01); A61B 5/6868 (2013.01); A61B 5/7225 (2013.01); H03M 3/464 (2013.01); A61B 5/0022 (2013.01); A61B 5/14532 (2013.01); A61B 5/14546 (2013.01); A61B 5/4094 (2013.01); A61B 2560/0219 (2013.01); H03M 3/43 (2013.01); H03M 3/462 (2013.01);
Abstract
Systems, methods and apparatuses described herein generally provide a millimetre size package-free complementary metal-oxide-semiconductor ('CMOS') chip (referred to as a 'die') for the in situ (on-site) measurement or imaging of electrochemically detectable analytes.
Quick Actions:
Soltani, Nima. (2021). System, methods and apparatuses for in situ electrochemical imaging (U.S. Patent No. 10973448). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10973448
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