The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2021

Filed:

Sep. 28, 2016
Applicant:

Mjnn Llc, South San Francisco, CA (US);

Inventors:

Jaremy Creechley, Laramie, WY (US);

Jack Oslan, Henderson, NV (US);

Nate Mazonson, Menlo Park, CA (US);

Nathaniel R. Storey, Laramie, WY (US);

Daniel Cook, Woodside, CA (US);

Philip E. Beatty, Tualatin, OR (US);

John L. Whitcher, Tualatin, OR (US);

Christopher K. Conway, Loomis, CA (US);

Ernest Learn, Loomis, CA (US);

Michael Duffy, Duryea, PA (US);

Russell Varone, Fremont, CA (US);

Russell Field, Portola Valley, CA (US);

William R. George, Santa Cruz, CA (US);

Rob Jensen, Rocklin, CA (US);

Benjamin J. Clark, Redwood City, CA (US);

Matthew Barnard, Woodside, CA (US);

Matteo Melani, Menlo Park, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01G 31/06 (2006.01); H05B 47/105 (2020.01); A01G 7/02 (2006.01); A01G 7/04 (2006.01); A01G 9/24 (2006.01); A01G 9/26 (2006.01); A01G 31/02 (2006.01); A01G 31/04 (2006.01); H04N 7/18 (2006.01); A01G 2/20 (2018.01); A01G 9/029 (2018.01); A01G 9/02 (2018.01); A01G 27/00 (2006.01); H05B 45/10 (2020.01);
U.S. Cl.
CPC ...
A01G 31/06 (2013.01); A01G 2/20 (2018.02); A01G 7/02 (2013.01); A01G 7/045 (2013.01); A01G 9/023 (2013.01); A01G 9/029 (2018.02); A01G 9/246 (2013.01); A01G 9/247 (2013.01); A01G 9/26 (2013.01); A01G 27/00 (2013.01); A01G 31/02 (2013.01); A01G 31/04 (2013.01); A01G 31/045 (2013.01); H04N 7/183 (2013.01); H05B 47/105 (2020.01); H05B 45/10 (2020.01); Y02P 60/21 (2015.11);
Abstract

A computer implemented system for a vertical farming system comprising at least a first crop growth module and operating in an environmentally-controlled growing chamber, the control system comprising sensors for measuring environmental growing conditions in the environmentally-controlled growing chamber over time to generate environmental condition data, a device configured for measuring a crop characteristic of a crop grown in the crop growth module of the environmentally-controlled growing chamber to generate crop growth data and a processing device comprising software modules for receiving the environmental condition data and the crop growth data; applying an algorithm to the environmental condition data and the crop growth data to generate an improved environmental growing condition and generating instructions for adjustment of the environmental growing conditions in or around the growth module in the environmentally-controlled growing chamber to the improved environmental growing condition.


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