The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jan. 29, 2013
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Valentin Alexandru Gheorghiu, Tokyo, JP;

Masato Kitazoe, Tokyo, JP;

Brian Clarke Banister, San Diego, CA (US);

Alexei Yurievitch Gorokhov, San Diego, CA (US);

Tingfang Ji, San Diego, CA (US);

Shivratna Giri Srinivasan, San Diego, CA (US);

Amir Farajidana, Sunnyvale, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04L 5/00 (2006.01); H04W 24/10 (2009.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04W 24/00 (2013.01); H04L 5/0048 (2013.01); H04L 5/0092 (2013.01); H04W 24/10 (2013.01); H04L 1/0026 (2013.01); H04L 5/0023 (2013.01); H04L 5/0064 (2013.01); H04L 5/0085 (2013.01);
Abstract

Methods and apparatus for performing reference signal (RS) metric measurements in different parts of a channel bandwidth are described. One example method generally includes receiving signaling indicating one or more frequency bands within an operating frequency band of a current serving cell for performing reference signal (RS) metric measurements, performing the measurements on the one or more frequency bands, and reporting the measurements.


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