The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Mar. 04, 2019
Applicant:
Fujitsu Limited, Kawasaki, JP;
Inventor:
Takahito Tanimura, Yokohama, JP;
Assignee:
FUJITSU LIMITED, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/07 (2013.01); G06N 20/00 (2019.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
H04B 10/07 (2013.01); G06N 20/00 (2019.01); G06N 3/08 (2013.01);
Abstract
A parameter analysis method executable by a computer, the method includes training a model configured to output an index value relating to a characteristic of an optical signal, and changing the characteristic of the optical signal usable for training the model.
Tanimura, Takahito. (2021). Parameter analysis method and apparatus (U.S. Patent No. 10972178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10972178
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