The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jul. 31, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Jaeduk Han, Albany, CA (US);

Wenbo Liu, Cupertino, CA (US);

Wing Liu, Milpitas, CA (US);

Ming-Shuan Chen, Santa Clara, CA (US);

Sanjeev K. Maheshwari, Fremont, CA (US);

Vishal Varma, Fremont, CA (US);

Sunil Bhosekar, Austin, TX (US);

Lizhi Zhong, Sunnyvale, CA (US);

Gary A. Rogan, Los Altos, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/08 (2006.01); H03L 7/081 (2006.01);
U.S. Cl.
CPC ...
H03L 7/0818 (2013.01); H03L 7/0807 (2013.01); H03L 2207/12 (2013.01);
Abstract

An apparatus includes a receiver buffer, a phase compensation circuit, a data sampler circuit, and an error sampler circuit. The receiver buffer may generate an equalized signal on a signal node using an input signal received via a channel. The phase compensation circuit may, in response to an initiation of a training mode, replace the equalized signal on the signal node with a reference signal. The data sampler circuit may sample, using a data clock signal, the reference signal to generate a plurality of data samples. The error sampler circuit may sample, using an error clock signal, the reference signal to generate a plurality of errors samples. The phase compensation circuit may also adjust a phase difference between the data clock signal and the error clock signal using at least some of the plurality of data samples and at least some of the plurality of error samples.


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