The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
May. 06, 2019
Samsung Display Co., Ltd., Yongin-si, KR;
Hyo Jung Kim, Yongin-si, KR;
June Hwan Kim, Yongin-si, KR;
Jong Woo Park, Yongin-si, KR;
Dae Guen Choi, Yongin-si, KR;
Jae Sik Son, Yongin-si, KR;
Young Tae Choi, Yongin-si, KR;
SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;
Abstract
Disclosed herein are a display device, an apparatus for testing a display device, and a method for testing a display device. A display device includes a first substrate having a display area and a non-display area defined thereon, the non-display area being on an outer side of the display area. The non-display area may include a plurality of test pads and a first dummy thin-film transistor electrically connected to the test pads. The first dummy thin-film transistor includes a dummy gate electrode, and a dummy source electrode and a dummy drain electrode insulated from the gate electrode and spaced apart from each other. A bending area is defined on the first substrate that at least partially traverses the display area and the non-display area, the bending area overlaps the first dummy thin-film transistor.