The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Sep. 13, 2018
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventor:

Anthony Paul Van Selow, Santa Clara, CA (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); G05B 19/418 (2006.01); C23C 16/52 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67253 (2013.01); C23C 16/52 (2013.01); G05B 19/41865 (2013.01); H01L 21/67063 (2013.01); H01L 21/67248 (2013.01); G05B 2219/45031 (2013.01);
Abstract

A substrate processing system to process a substrate includes a sensor to generate sensed values of a parameter of the substrate processing system. An actuator adjusts the parameter of the substrate processing system. A controller communicates with the sensor and the actuator and is configured to process a first substrate using the sensed values to adjust control values for controlling the actuator without feedforward control during a process. The sensed values are delayed and cause instability in the parameter. The controller is further configured to automatically calibrate feedforward values for processing a second substrate based on the sensed values and the control values and process the second substrate while controlling the actuator using the feedforward values.


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