The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Nov. 18, 2016
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/16 (2006.01); H01J 49/06 (2006.01); G01N 27/622 (2021.01); H01J 49/14 (2006.01);
U.S. Cl.
CPC ...
H01J 49/164 (2013.01); G01N 27/622 (2013.01); H01J 49/0004 (2013.01); H01J 49/061 (2013.01); H01J 49/142 (2013.01); H01J 49/161 (2013.01);
Abstract
An ion analyzer includes: a sample placement uniton which a sampleis to be placed; an excitation beam irradiation unitthat irradiates the sampleplaced on the sample placement unitwith an excitation beam in a direction perpendicular to a surface of the sample; a deflection unitthat makes at least some of ions generated from the sampleto fly in a direction deviating from an irradiation path of the excitation beam; and an analysis unitdisposed in a flight direction of ions deflected by the deflection unit, that separates and measures the ions in accordance with a predetermined physical quantity.