The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Aug. 22, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aravindan J. Busi, Bangalore, IN;

John R. Goss, South Burlington, VT (US);

Paul J. Grzymkowski, Middlesex, VT (US);

Krishnendu Mondal, Bangalore, IN;

Kiran K. Narayan, Hyderabad, IN;

Michael R. Ouellette, Westford, VT (US);

Michael A. Ziegerhofer, Jeffersonville, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G11C 29/44 (2006.01); G11C 29/40 (2006.01); G11C 29/56 (2006.01); G11C 29/00 (2006.01); G11C 29/36 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 29/40 (2013.01); G11C 29/44 (2013.01); G11C 29/56004 (2013.01); G11C 29/70 (2013.01); G11C 29/4401 (2013.01); G11C 2029/3602 (2013.01);
Abstract

A BIST engine configured to store a per pattern based fail status during memory BIST run and related processes thereof are provided. The method includes testing a plurality of patterns in at least one memory device and determining which of the plurality of patterns has detected a fail during execution of each pattern. The method further includes storing a per pattern based fail status of each of the detected failed patterns.


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