The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Mar. 15, 2019
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Masahiro Tani, Singapore, SG;
Takeshi Arikuma, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 29/18 (2006.01); H04N 7/18 (2006.01); G08B 13/196 (2006.01); G08B 25/00 (2006.01); G08B 13/19 (2006.01); G08B 17/12 (2006.01);
U.S. Cl.
CPC ...
G08B 29/188 (2013.01); G08B 13/19 (2013.01); G08B 13/19697 (2013.01); G08B 25/006 (2013.01); H04N 7/188 (2013.01); G08B 13/19643 (2013.01); G08B 17/125 (2013.01);
Abstract
A system for monitoring event related data including a sensor data analyzer, an event analyzer and an actuator is disclosed. The sensor data analyzer detects events based on sensor data, the event analyzer couples to the sensor data analyzer and estimates the size of the detected entire events based on event related data of the detected events from the sensor data analyzer, and the actuator couples to the sensor data analyzer and the event analyzer and actuates a predetermined device based on the estimated size of the detected entire events.