The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Mar. 23, 2018
Jlk Inspection, Cheongju-si, KR;
Dongmin Kim, Gumi-si, KR;
Jonghwan Back, Ulsan, KR;
Myung Jae Lee, Seoul, KR;
Jisoo Son, Incheon, KR;
Shin Uk Kang, Seoul, KR;
Tae Won Kim, Suwon-si, KR;
Dong-Eog Kim, Seoul, KR;
JLK INSPECTION, Cheongju-si, KR;
Abstract
An apparatus for image analysis includes: an image acquisition unit for stacking a plurality of two-dimensional image data in a predetermined order; a three-dimensional image generation unit for generating a plurality of three-dimensional data on the basis of different types of multiple items of information for the plurality of two-dimensional image data in a stacked form from the image acquisition unit; and a deep learning algorithm analysis unit for applying a two-dimensional convolutional neural network to each of the plurality of three-dimensional data from the three-dimensional image generation unit, and combining results of applying the two-dimensional convolutional neural network to the plurality of three-dimensional data.