The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Oct. 29, 2018
Applicant:

Applied Predictive Technologies, Inc., Arlington, VA (US);

Inventors:

Jeffrey Campbell, Arlington, VA (US);

Kai Fei, Arlington, VA (US);

Stephen Kent, Philadelphia, PA (US);

Ameya Pathare, Washington, DC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/245 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2228 (2019.01); G06F 16/245 (2019.01);
Abstract

The computer system and method described herein attempt to address the deficiencies by analyzing all relevant data points for each test and control location collectively determine outliers and then exclude the individual outlier data points from the data when analyzing an initiative during a relevant test period. Rather than exclude outliers at the site level, the particular time increment having the outlier data can be extracted and the site can remain in the analysis.


Find Patent Forward Citations

Campbell, Jeffrey. (2021). Computer system and method of initiative analysis using outlier identification (U.S. Patent No. 10970263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10970263

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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