The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Oct. 29, 2018
Applicant:
Applied Predictive Technologies, Inc., Arlington, VA (US);
Inventors:
Jeffrey Campbell, Arlington, VA (US);
Kai Fei, Arlington, VA (US);
Stephen Kent, Philadelphia, PA (US);
Ameya Pathare, Washington, DC (US);
Assignee:
Applied Predictive Technologies, Inc., Arlington, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/245 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2228 (2019.01); G06F 16/245 (2019.01);
Abstract
The computer system and method described herein attempt to address the deficiencies by analyzing all relevant data points for each test and control location collectively determine outliers and then exclude the individual outlier data points from the data when analyzing an initiative during a relevant test period. Rather than exclude outliers at the site level, the particular time increment having the outlier data can be extracted and the site can remain in the analysis.