The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Aug. 15, 2019
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventors:

Qun Wu, Shanghai, CN;

Xuefeng Chen, Shanghai, CN;

Dong-Rui Xue, Shanghai, CN;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3062 (2013.01); G06F 11/3476 (2013.01); G06F 11/3684 (2013.01);
Abstract

An automatic test system suitable for testing a server comprises a storage device, a computing device, and a sensing device. The storage device stores an automatic test script. The sensing device collects a plurality of test results of the server. The automatic test script comprises a parameter configuration module, a data processing module, and a core logic module. The parameter configuration module provides a plurality of configuration parameters associated with a server test procedure. The data processing module comprises a data recording sub-module and a data sorting sub-module, while the former receives an output data set from the server test procedure, and the latter generates a test report according to the output data set and the configuration parameters. The core logic module comprises a plurality of instruction sets for controlling the server test procedure through a data exchange interface.


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