The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Feb. 01, 2019
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Hung Dinh, Austin, TX (US);
Reddeppa Kollu, Leander, TX (US);
Venkat Allaka, Cedar Park, TX (US);
Sabu Syed, Austin, TX (US);
Jyothi K R, Bangalore, IN;
Anu Bala Thakur, Chandigarh, IN;
Madhusudhana Reddy Chilipi, Leander, TX (US);
Chakradhar Kommana, Cedar Park, TX (US);
Tousif Mohammed, Bangalore, IN;
Vinod Kumar, Bangalore, IN;
Manikandan Pammal Rathinavelu, Cedar Park, TX (US);
Abhishek Joshi, Telengana, IN;
John K. Maxi, New Orleans, LA (US);
Jatin Kamlesh Thakkar, Bangalore, IN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
A method is disclosed including: obtaining one or more values of a system metric, the system metric being associated with a hardware resource of a computing device; detecting whether the system metric is approaching a threshold, the threshold being associated with a key performance indicator (KPI) of the computing device, the detecting being performed based on the obtained values of the system metric; calculating a predicted value of the system metric in response to detecting that the system metric is approaching the threshold, the predicted value of the system metric being calculated by using a linear predictor that is trained using unevenly-sampled training data; detecting whether the predicted value of the system metric exceeds the threshold; and reconfiguring the computing device to prevent the system metric from reaching the predicted value in response to detecting that the predicted value exceeds the threshold.