The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10970158 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 06, 2021

Filed:

Aug. 20, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hernan A. Cunico, Holly Springs, NC (US);

Jonathan Dunne, Dungarvan, IE;

Jeremiah O'Connor, Roscommon, IE;

Asima Silva, Holden, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 3/01 (2006.01); G06F 3/023 (2006.01); G06F 3/033 (2013.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 3/012 (2013.01); G06F 3/013 (2013.01); G06F 3/023 (2013.01); G06F 3/033 (2013.01); G06F 11/0706 (2013.01); G06F 11/0787 (2013.01); G06F 2203/011 (2013.01);
Abstract

A method and system for performing a root cause analysis. A central processing unit (CPU) tracks a focal point of a user's eye gaze. The CPU correlates the focal point of the user's eye gaze to a viewing position of a display device displaying a file that includes event data being viewed by the user. The CPU identifies, as a function of the viewing position, events of interest in the event data and an amount of time that the event data is viewed by the user. The CPU outputs, as a function of a linear regression model, an interest score pertaining to one or more events of interest that were previously identified as a function of the user's eye gaze. The interest score is a probability of each identified event of interest being a root cause of a defect.


Find Patent Forward Citations

Cunico, Hernan. (2021). Root cause analysis (U.S. Patent No. 10970158). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10970158

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