The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Mar. 15, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Larisa Shwartz, Greenwich, CT (US);

John Davis, Winchester, GB;

Victoria Lee Guerra, Yorktown Heights, NY (US);

Amitkumar Paradkar, Mohegan Lake, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 8/77 (2018.01); G06F 8/73 (2018.01);
U.S. Cl.
CPC ...
G06F 8/77 (2013.01); G06F 8/73 (2013.01);
Abstract

A technique relates to computer artifacts in a computer system. The technique includes creating a list of insights from artifacts, determining a similarity level between the insights of the artifacts and a predefined area of capability, comparing similarity level of insights for each of the artifacts to a threshold metric, removing artifacts having the similarity level below threshold metric such that artifacts remaining meet the threshold metric, and performing a pair-wise similarity comparison on the artifacts remaining which compares insights of the artifacts to each other to determine which ones are least common. The technique includes creating feature vectors for artifacts that are least common, determining a feature vector having a most variation in feature vectors, an artifact associated with the feature vector being determined to comprise a unique insight, and generating a unique message using the artifact associated with the feature vector being the unique insight.


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