The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Jan. 24, 2019
Fuji Xerox Co., Ltd., Tokyo, JP;
Takashi Hatakeyama, Kanagawa, JP;
Nobuhide Inaba, Kanagawa, JP;
Shuhei Kobayakawa, Kanagawa, JP;
Masafumi Kudo, Kanagawa, JP;
FUJI XEROX CO., LTD., Tokyo, JP;
Abstract
An inspection information prediction apparatus includes an environment-information acquisition unit that acquires environment information of a routing step through which an inspection target has been routed before an inspection step of inspecting the inspection target, a manufacturing-information acquisition unit that acquires manufacturing information of the inspection target, and a prediction unit that predicts inspection information which indicates an inspection result of an inspection portion of the inspection target determined by the manufacturing information and is obtained by applying the environment information, based on the manufacturing information of the inspection target and the environment information of the routing step through which the inspection target has been routed.