The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Oct. 16, 2018
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Eric C. Fest, Tucson, AZ (US);

Jon E. Leigh, Tucson, AZ (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/28 (2006.01); G01J 4/04 (2006.01); G06T 7/33 (2017.01); G02B 5/20 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G02B 27/286 (2013.01); G01J 4/04 (2013.01); G02B 5/201 (2013.01); G02B 5/3025 (2013.01); G06T 7/344 (2017.01); G06T 2207/10048 (2013.01);
Abstract

Polarized pixelated filter sub-array is reconfigured to reduce sensitivity to misalignment. The condition number increases more slowly than the standard polarized pixelated filter sub-array as the misalignment increases. In different embodiments, the filter sub-array is configured such that the condition number has a finite bound at ½ pixel misalignment. The angular values of the polarizer filter array are determined to minimize the sensitivity of the condition number of the data reduction matrix to misalignment. This can be achieved by selecting angular values that minimize the expected value of the condition number E(CN) over the range of misalignment.


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