The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Oct. 08, 2018
Applicant:

Olympus Corporation, Hachioji, JP;

Inventor:

Satoshi Takinoiri, Yokohama, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/09 (2021.01); G02B 21/00 (2006.01); G02B 7/36 (2021.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 7/09 (2013.01); G02B 7/365 (2013.01); G02B 21/006 (2013.01); G02B 21/244 (2013.01); G02B 21/365 (2013.01);
Abstract

An observation device, comprising an image sensor that forms images of a specimen and outputs an image signal, an AF detection circuit that calculates evaluation values based on the image signal, and a focus control circuit that controls focus position based on the evaluation values, wherein the AF detection circuit calculates a plurality of evaluation values based on signals relating to a plurality of frequency bands of the image signal, and the focus control circuit controls focus position based on maximum value or minimum value of the plurality of evaluation values.


Find Patent Forward Citations

Takinoiri, Satoshi. (2021). Observation device and focus adjustment method (U.S. Patent No. 10969562). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10969562

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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