The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Oct. 18, 2017
Applicant:

Benewake (Beijing) Co., Ltd., Beijing, CN;

Inventors:

Qingshun Zhang, Beijing, CN;

Jiang Wu, Beijing, CN;

Kai Zheng, Beijing, CN;

Da Shu, Beijing, CN;

Yuan Li, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/481 (2006.01); G02B 19/00 (2006.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4814 (2013.01); G01S 7/4813 (2013.01); G01S 17/42 (2013.01); G02B 19/0028 (2013.01); G02B 19/0047 (2013.01);
Abstract

An infrared range-measurement device includes an emitting module, a receiving module and a calculating module, the emitting module includes an emitting light source and a driving circuit, and the receiving module includes a planar array photosensitive chip. The emitting light source, under the drive of the driving circuit, emits a test light beam, the test light beam is reflected by an object in a test range and then is incident on the planar array photosensitive chip, and the calculating module outputs a test light intensity or a test distance; an emitting lens is provided in an emitting light path of the emitting module. By shaping the test light beam to control a divergence angle and a shape of the light beam, and to make it match with the set working area of the planar array photosensitive chip, the overall utilization ratio of the test light beam is increased.


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