The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jul. 23, 2018
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Richard E. Clymer, Concord, NH (US);

Luke D. St. Martin, Lunenburg, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 3/48 (2006.01); G01S 3/28 (2006.01); G01S 3/22 (2006.01); G01S 3/14 (2006.01); H04B 17/391 (2015.01); G01S 3/06 (2006.01);
U.S. Cl.
CPC ...
G01S 3/48 (2013.01); G01S 3/06 (2013.01); G01S 3/146 (2013.01); G01S 3/22 (2013.01); G01S 3/28 (2013.01); H04B 17/3912 (2015.01);
Abstract

A system and method that can determine the direction of origin within 360 degrees around an antenna array for an emitted signal with a high degree of accuracy, even when the array is installed in a corrupted or 'unclean' environment. Further, the provided system and method can provide a more accurate indication of direction despite polarization of the detected signal. Finally, the provided system and method can provide accurate results from phase measurements, amplitude measurements, or both phase and amplitude measurements, from an emitted signal where a phase network can be used to tailor the amplitude and phase variations versus spatial angle to best match the receiver measurement accuracies.


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