The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jul. 30, 2019
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;

Inventor:

Tsuneyuki Hayashi, Kodaira, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2879 (2013.01); G01R 31/2856 (2013.01); G01R 31/2889 (2013.01);
Abstract

A semiconductor integrated circuit includes abnormality detectors configured to detect abnormalities in the semiconductor integrated circuit, and a reference voltage output circuit. The reference voltage output circuit includes switches controlled in accordance with detection signals from the abnormality detectors. The reference voltage output circuit is configured to output as an error signal, a reference voltage having one of a plurality of different values depending on conduction states of the switches of the reference voltage output circuit.


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Hayashi, Tsuneyuki. (2021). Semiconductor integrated circuit (U.S. Patent No. 10969426). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10969426

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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