The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Sep. 29, 2018
Keysight Technologies, Inc., Santa Rosa, CA (US);
Keith F. Anderson, Santa Rosa, CA (US);
Alex Grichener, Plymouth, MN (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A test instrument, including an embedded VNA circuit, for testing a DUT. The test instrument includes a first receiver for receiving an incident RF signal through a first coupling device; a second receiver for receiving a reflected RF signal through a second coupling device; a test port for connecting to an interconnect, which is connectable to a calibration device in a calibrating stage, during which the interconnect is characterized, and to the DUT in a testing stage, during which at least one parameter of the DUT is tested; an RF source for generating the incident RF signal during the calibrating stage; and a processing unit programmed to determine S-parameters of the interconnect based on the incident RF signal and the reflected RF signal, the S-parameters compensating for error introduced by the interconnect when testing the at least one parameter of the DUT in the testing stage.