The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Sep. 12, 2019
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, CN;
Abstract
Device and method for measuring in-situ time-resolved X-ray absorption spectrum. The device comprises an X-ray source, a first slit, an acousto-optic tunable X-ray filter, a radio frequency transmitter, a second slit, a front ionization chamber, a front ionization chamber signal amplifier, a sample to be tested, a rear ionization chamber, a rear ionization chamber signal amplifier, a data collector, and a computer. The X-ray source, the acousto-optic tunable X-ray filter, and the radio frequency transmitter are used to generate a monochromatic X-ray beam; the front ionization chamber is used to measure the intensity of the X-ray beam before passing through the sample; the rear ionization chamber is used to measure the intensity of the X-ray beam after passing through the sample; the front ionization chamber signal amplifier, the rear ionization chamber signal amplifier, the data collector, and the computer are used for data acquisition and data processing.