The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Feb. 24, 2020
Seiko Epson Corporation, Tokyo, JP;
Seiji Aiso, Shiojiri, JP;
Abstract
A spectroscopic inspection method is a spectroscopic inspection method of performing an inspection using a spectral image, including an imaging step of executing imaging processing of imaging an object within an imaging range of a spectral camera using the spectral camera and acquiring the spectral image, an inspection step of executing inspection processing of executing imaging processing on the spectral image and outputting a result of the image processing as an inspection result, a signal transmission step of executing transmission processing of transmitting a signal for operation of the object based on the inspection result, and a setting step of setting a work procedure of the imaging processing, the inspection processing, and the signal transmission processing, wherein the setting step sets the work procedure to execute the inspection step after the imaging step ends and execute the signal transmission step after the imaging step ends and before the inspection step ends.