The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jun. 19, 2019
Applicant:

Ecole Polytechnique Federale DE Lausanne (Epfl), Lausanne, CH;

Inventors:

Tobias Kippenberg, Lausanne, CH;

Hairun Guo, Lausanne, CH;

Junqiu Liu, Lausanne, CH;

Wenle Weng, Lausanne, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/10 (2006.01); G02F 1/365 (2006.01); G02F 1/35 (2006.01);
U.S. Cl.
CPC ...
G01J 3/10 (2013.01); G01J 3/108 (2013.01); G02F 1/365 (2013.01); G01J 2003/102 (2013.01); G02F 2001/3528 (2013.01); G02F 2201/06 (2013.01); G02F 2203/11 (2013.01);
Abstract

A dual-frequency-comb spectrometer and a method for spectroscopic investigation of a sample are described. The spectrometer includes first and second frequency comb devices for emitting laser pulses along first and second light paths, wherein the repetition frequency of the laser pulses emitted by the second device is offset from that of the first device. First and second multi-core waveguides including at least two separate single core waveguides having field-coupling via a coupling gap therebetween are arranged in the first and second light paths. The sample is irradiated by the second frequency comb in the second light path. A detector device is arranged in a third light path where the first and second light paths are combined, for simultaneously sensing the first frequency comb and the second frequency comb after an interaction with the sample. A computing device receives output of the detector device and calculates spectroscopic properties of the sample.


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