The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Jun. 21, 2017
Applicants:

Soreq Nuclear Research Center, Yavne, IL;

Security Matters Ltd., D.N. Hevel Eilot, IL;

Inventors:

Yair Grof, Rehovot, IL;

Tzemah Kislev, Mazkeret Bathya, IL;

Nadav Yoran, Tel Aviv, IL;

Haggai Alon, Kibbutz Naan, IL;

Mor Kaplinsky, Herzliya, IL;

Assignees:

SOREQ NUCLEAR RESEARCH CENTER, Yavne, IL;

SECURITY MATTERS LTD., D.N. Hevel Eilot, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/34 (2006.01); G01N 23/223 (2006.01); B07C 5/342 (2006.01);
U.S. Cl.
CPC ...
B07C 5/3412 (2013.01); B07C 5/3427 (2013.01); G01N 23/223 (2013.01); G01N 2223/643 (2013.01);
Abstract

The present invention discloses a novel XRF analyzer capable of simultaneously identifying the presence of a marking composition in a plurality of objects by modulating/varying the intensity of the excitation beam on the different objects and measuring the secondary radiation thereof. The XRF analyzer comprises a radiation emitter assembly adapted for emitting at least one X-Ray or Gamma-Ray excitation radiation beam having a spatial intensity distribution for simultaneously irradiating the plurality of objects; a radiation detector for detecting secondary radiation X-Ray signals arriving from a plurality of objects in response to irradiation of the objects by X-Ray or Gamma-Ray radiation, and providing data indicative of spatial intensity distribution of the detected data X-Ray signals on the plurality of objects; and a signal reading processor in communication with the detector, the processor being adapted for receiving and processing the detected response X-Ray signals to verify presence of the marking composition included at least one surface of each object of the plurality objects.


Find Patent Forward Citations

Loading…