The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2021

Filed:

Nov. 16, 2017
Applicant:

Aeris Gmbh, Haar bei Munich, DE;

Inventor:

Josef Glöckl, Munich, DE;

Assignee:

AERIS GMBH, Haar bei Munchen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/11 (2006.01); A61B 5/00 (2006.01); G06Q 10/06 (2012.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1116 (2013.01); A61B 5/11 (2013.01); A61B 5/6889 (2013.01); A61B 5/6898 (2013.01); G06K 9/00342 (2013.01); G06K 9/00382 (2013.01); G06Q 10/0633 (2013.01);
Abstract

The invention relates to a workplace analysis system () in a work area () for the acquisition and analysis of the presence of a person (P) to be monitored in several differently defined zones (A, B, C) of the work area () and of at least the temporal duration of stay (t, t, t) of the person (P) to be monitored within the zones (A, B, C), wherein in the workplace analysis system () at least one acquisition device () is provided, which is designed to detect and to acquire the presence and the duration of stay (t, t, t) of the person (P) to be monitored in the respective zones (A, B, C), and an analysis device () is provided, which is designed to analyze and evaluate the presence and the duration of stay (t, t, t) of the person (P) to be monitored in the respective zones (A, B, C).


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