The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Oct. 02, 2018
Alcon Inc., Fribourg, CH;
Muhammad K. Al-Qaisi, Ladera Ranch, CA (US);
Alcon Inc., Fribourg, CH;
Abstract
Techniques for measuring optical aberrations of the eye are disclosed. An example method comprises positioning the eye in a measurement location adjacent to a measurement arm of an optical coherence tomography (OCT) interferometer apparatus, so that source light from the measurement arm passes into the anterior segment of the eye and detecting an interference pattern, the interference pattern resulting from a combination of light reflected from the eye and light reflected from a reference arm of the OCT interferometer apparatus. Based on the interference pattern, an optical delay between a reference surface in the anterior segment of the eye and a measured surface in the eye is calculated, the reference surface being the anterior surface of the cornea or the lens, wherein said calculating comprises measuring an optical phase shift between the reference surface and the measured surface, based on the detected interference pattern.