The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2021
Filed:
Aug. 04, 2016
Applicants:
Canon U.s.a., Inc., Melville, NY (US);
Kenji Yamazoe, Tochigi, JP;
Anderson Mach, Cambridge, MA (US);
Zhuo Wang, Santa Clara, CA (US);
Inventors:
Assignee:
Canon U.S.A., Inc., Melville, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 5/00 (2006.01); A61B 1/07 (2006.01); G02B 23/24 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00181 (2013.01); A61B 1/00096 (2013.01); A61B 1/00165 (2013.01); A61B 1/00172 (2013.01); A61B 1/00177 (2013.01); A61B 1/00179 (2013.01); A61B 1/00188 (2013.01); A61B 5/0062 (2013.01); A61B 5/0084 (2013.01); G02B 23/2461 (2013.01); A61B 1/07 (2013.01);
Abstract
Exemplary apparatus and optical systems for forward and side view apparatus are described. These apparatus include a light focusing element, a grating element inclined with respect to the optical axis of the apparatus, and a transparent element. The transparent element has a proximal surface in contact with the grating element and an inclined distal surface. Such apparatus can be used as spectrally encoded endoscopy (SEE) probes.