The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Jun. 20, 2012
Applicants:

Michael D. Stuart, Issaquah, WA (US);

James T. Pickett, Santa Cruz, CA (US);

Inventors:

Michael D. Stuart, Issaquah, WA (US);

James T. Pickett, Santa Cruz, CA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); G01J 5/02 (2006.01); G01J 5/08 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); G01J 5/025 (2013.01); G01J 5/0265 (2013.01); G01J 5/089 (2013.01);
Abstract

A method and computer program product for determining whether an object of interest can have its temperature measurement calculated by a thermal imaging camera. To do this, the measurement IFOV is converted into linear units. The measurement IFOV may be displayed on the display of the camera as a graphical indicator ('″) or a value. An object of interest can be registered with the graphical indicator (′″) or its dimension compared with the measurement IFOV and then it is determined whether the temperature measurement of the object can be acceptably calculated. Alternately, data obtained by a matrix of pixel elements may be analyzed to determine whether an accurate temperature can be calculated.


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