The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Jun. 12, 2019
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Dhebeha Jayakumar, Neyveli, IN;

Vignesh Karunakaran, Kanchipuram, IN;

Swaminathan Seetharaman, Chennai, IN;

Assignee:

Wipro Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/04 (2013.01);
Abstract

This disclosure relates to methods and systems for effective data collection, aggregation, and analysis in a distributed heterogeneous communication network for effective fault detection or performance anomaly detection. In one embodiment, the method may include determining impact characteristics with respect to a network slice or a service in the distributed heterogeneous communication network. The method may further include determining one or more collection nodes, one or more aggregation nodes, and one or more analysis nodes within the distributed heterogeneous communication network based on the impact characteristics. The method may further include activating the one or more collection nodes for collecting data, the one or more aggregation nodes for aggregating the collected data, and the one or more analysis nodes for analyzing the aggregated data. The impact characteristics may include at least one of: user characteristics, service characteristics, slice characteristics, network characteristics, or performance characteristics.


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