The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Jun. 12, 2020
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Junxian Weng, Ottawa, CA;

Christopher Kurowski, Nepean, CA;

Sadok Aouini, Gatineau, CA;

Naim Ben-Hamida, Nepean, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0612 (2013.01);
Abstract

Described herein are apparatus and methods for a high bandwidth under-sampled successive approximation register (SAR) analog to digital converter (ADC) (SAR ADC) with non-linearity minimization. A method includes sampling, by a sampling switch triggered by a sampling clock in the SAR ADC, an input signal, determining, by a comparator in the SAR ADC, a value for a bit based on comparing the sampled input signal to a reference signal provided by a reference digital-to-analog (DAC) in the SAR ADC, wherein the input signal and the reference signal propagate through substantially similar input paths, resampling, by the sampling switch, the input signal for each successive bit, determining, by the comparator, a value for each successive bit based on comparing the resampled input signal and a reference signal for each successive bit, and outputting, by a digital controller, a digital result after determining a value for a last bit by the comparator.


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