The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Aug. 14, 2019
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Yoshisato Yokoyama, Tokyo, JP;

Shinji Tanaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/18 (2006.01); G11C 7/22 (2006.01); G11C 29/12 (2006.01); G11C 29/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/18 (2013.01); G11C 7/22 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1802 (2013.01); G11C 2029/2602 (2013.01);
Abstract

A semiconductor device capable of detecting whether test operation is normal is provided. The semiconductor device includes a plurality of memory cells arranged in a matrix, a plurality of word lines provided corresponding to each of the rows of the plurality of memory cells respectively, a decoder for generating driving signals for driving the plurality of word lines, and a detection circuit provided between the plurality of word lines and the decoder for simultaneously raising the plurality of word lines by test operation and detecting whether or not the rising state of the plurality of word lines is normal.


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