The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Mar. 14, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Naoko Yoshida, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/90 (2017.01); G01N 21/27 (2006.01); G01N 21/31 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/90 (2017.01); G01N 21/27 (2013.01); G01N 21/31 (2013.01); G06T 7/0004 (2013.01); G06T 7/0012 (2013.01); G01N 2201/1293 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/30088 (2013.01);
Abstract

An applied state of a cosmetic material on skin is easily and accurately evaluated. A principal component analysis unitperforms principal component analysis on a spectral reflectance measured from a spectral image and calculates eigenvectors of first to third principal components and principal component scores of the first to third principal components based on the eigenvectors of the first to third principal components, and a skin evaluation unitevaluates an applied state of a cosmetic material on skin using at least one of the calculated principal component scores of the first to third principal components and a preset threshold value or a discriminant function of each principal component.


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