The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Dec. 04, 2019
Nec Laboratories America, Inc., Princeton, NJ (US);
Eric Cosatto, Red Bank, NJ (US);
Felix Wu, Ithaca, NY (US);
Alexandru Niculescu-Mizil, Plainsboro, NJ (US);
NEC Corporation, , JP;
Abstract
A method is provided for model training to detect defective products. The method includes sampling training images of a product to (i) extract image portions therefrom made of a center patch and its context and (ii) black-out the center patch. The method further includes performing unsupervised back-propagation training of a Contextual Auto-Encoder (CAE) model using (i) the image portions with the blacked-out center patch as an input and, (ii) the center patch as a target output and, (iii) an image-based loss function, to obtain a trained CAE model. The method also includes sampling positive and negative center-patch-sized portions from the training images. The method additionally includes normalizing, using the trained CAE model, the positive and negative center-patch-sized portions. The method further includes performing supervised training of a classifier model using the normalized positive and negative center-patch-sized portions to obtain a trained supervised classifier model for detecting the defective products.