The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Feb. 03, 2020
Alitheon, Inc., Bellevue, WA (US);
David Justin Ross, Bellevue, WA (US);
Will Charles Shannon, Bellevue, WA (US);
Cheng Qian, Bellevue, WA (US);
ALITHEON, INC., Bellevue, WA (US);
Abstract
The present disclosure teaches a method of utilizing image 'match points' to measure and detect changes in a physical object. In some cases 'degradation' or “wear and tear” of the physical object is assessed, while in other applications this disclosure is applicable to measuring intentional changes, such as changes made by additive or subtractive manufacturing processes, which may, for example, involve adding a layer or removing a layer by machining. A system may include a scanner, and a digital fingerprinting process, coupled to an object change computer server. The server is coupled to a datastore that stores class digital fingerprints, selected object digital fingerprints collected over time, match measurements, and deterioration metrics.