The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Aug. 04, 2016
Applicant:
Servicenow, Inc., Santa Clara, CA (US);
Inventors:
Gabby Menahem, Petach Tikva, IL;
Dror Mann, Tel Aviv, IL;
Yaron Lehmann, Tel Aviv, IL;
Eli Polonsky, Tel Aviv, IL;
Assignee:
ServiceNow, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 40/18 (2020.01); H04L 29/06 (2006.01); G06F 40/30 (2020.01); G06F 40/284 (2020.01); H04L 12/24 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 40/18 (2020.01); G06F 40/284 (2020.01); G06F 40/30 (2020.01); H04L 41/0631 (2013.01); H04L 41/142 (2013.01); H04L 63/1433 (2013.01); H04L 63/20 (2013.01); H04L 69/22 (2013.01); H04L 67/06 (2013.01);
Abstract
A system and method for classifying machine-generated textual data into statistical metrics are determined. The system comprises receiving machine-generated textual data from at least one data source; grouping the machine-generated textual data into a plurality of events; processing each event to determine a plurality of elements embedded therein; determining a type of each of the plurality of elements; and determining a statistical metric for each element based on at least on the type of the element.