The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Mar. 18, 2019
Salesforce.com, Inc., San Francisco, CA (US);
Nathan Irace Burke, Brooklyn, NY (US);
Kexin Xie, San Mateo, CA (US);
Xingyu Wang, San Francisco, CA (US);
Wanderley Liu, Sunnyvale, CA (US);
David Yourdon, Durham, NC (US);
salesforce.com, inc., San Francisco, CA (US);
Abstract
A data processing server may receive a set of data objects for frequent pattern (FP) analysis. The set of data objects may be analyzed using an attribute diversity technique. For the set of data attributes of the set of data objects, the server may arrange the attributes in one or more dimensions. The server may initialize a set of centroids on data points and identify mean values of nearby data points. Based on an iteration of the mean value calculation, the server may identify a set of attributes corresponding to final mean values as being groups of similarly frequent attributes. These groups of similarly frequent attributes may be analyzed using an FP analysis procedure to identify frequent patterns of data attributes.