The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Sep. 18, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takaki Matsushita, Tokyo, JP;

Yusuke Yamaga, Tokyo, JP;

Akira Deguchi, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 16/27 (2019.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 16/27 (2019.01); G06F 3/065 (2013.01); G06F 3/0647 (2013.01);
Abstract

The operational performance and the I/O performance of Snapshots in a storage system are balanced. In a storage system, meta information of data appended to a log structured area is composed of meta information of a first tier and meta information of a second tier which correlate location information of data in a logical volume and location information of data in the log structured area. When creating a snapshot of the logical volume, a data management unit creates, in the same meta information area as a replication source, a replication of the meta information of the first tier stored in a plurality of meta information areas assigned to a plurality of controllers. A data control unit accesses the data of the log structured area from the logical volume, and accesses the data of the log structured area from the snapshot.


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