The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Oct. 15, 2014
Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventor:

Calvin Hsia, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 9/50 (2006.01); G06F 11/30 (2006.01); G06F 11/32 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 12/023 (2013.01); G06F 9/5016 (2013.01); G06F 11/3037 (2013.01); G06F 11/323 (2013.01); G06F 12/02 (2013.01); G06F 3/0604 (2013.01); G06F 3/0608 (2013.01); G06F 3/0641 (2013.01); G06F 2201/83 (2013.01); G06F 2201/84 (2013.01);
Abstract

The subject disclosure relates to analyzing memory allocations for one or more computer-implemented processes. In particular, in conjunction with employing tags for tracking memory allocation commands, currently allocated memory can be examined for various characteristics of inefficient memory use. For example, as memory is initially allocated, a predetermined bit pattern can be written to the newly allocated memory. Thus, detection of the predetermined bit pattern can be indicative of wasted memory use. Moreover, additional features can be provided to both analyze data and present views associated with that analysis relating to identification of memory fragmentation, over-allocation, sparse memory use, duplication of allocations, multiple module loads, and so forth.


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