The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Jun. 13, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andrew Hicks, Wappingers Falls, NY (US);

Dale E. Blue, Poughkeepsie, NY (US);

Ryan Rawlins, New Paltz, NY (US);

Steven Partlow, Beacon, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3612 (2013.01); G06F 11/3688 (2013.01);
Abstract

Systems, methods, and computer-readable media are described for generating fingerprints for regression tests that identify code paths taken during execution of the regression tests. Breakpoint values are assigned to breakpoints encountered during execution of a regression test and a fingerprint is generated based on the assigned breakpoint values and a code path taken during execution of the regression test. Various breakpoint value assignment/fingerprint generation algorithms are described herein that generate a fingerprint from which a corresponding code path taken can be reconstructed including which breakpoints are encountered, the number of times each such breakpoint is encountered, and the order in which the breakpoints are encountered.


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