The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Aug. 22, 2017
Robert Bosch Gmbh, Stuttgart, DE;
Ruobing Chen, Palo Alto, CA (US);
Shan Kang, Mountain View, CA (US);
Rumi Ghosh, Campbell, CA (US);
Soundar Srinivasan, Sunnyvale, CA (US);
Zubin Abraham, Mountain View, CA (US);
Robert Bosch GmbH, Stuttgart, DE;
Abstract
A manufacturing process system comprises any number of assembly stations and test stations, a model unit, and any number of final products is provided. Any of a sample test method and the statistical distribution monitoring method performed by the model unit is configured to monitor the model quality after it is deployed and reduce potential unnecessary costs, such as warranty claim costs as a result of sending bad units to the customers, and rework costs as a result of predicting a good part as bad and wasting additional testing efforts on the bad parts. Further, both methods are configured to maximize the probability of detecting hazardous issues, while having control of the false alarm rate.