The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Feb. 10, 2020
Applicant:
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Inventors:
George Themelis, Lindau, DE;
Tobias Wilken, St. Gallen, CH;
Assignee:
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/204 (2018.01); G02B 21/36 (2006.01); G06T 7/62 (2017.01); G06T 7/70 (2017.01); G02B 21/00 (2006.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/0012 (2013.01); G06T 7/62 (2017.01); G06T 7/70 (2017.01); G06T 17/00 (2013.01); H04N 13/204 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30004 (2013.01); G06T 2210/41 (2013.01);
Abstract
A controller for a microscope is configured to receive image data representing a wound and to determine a line of sight to a bottom of the wound using the image data. The controller is further configured to output a control signal for the microscope, the control signal instructing the microscope to align its optical axis with the line of sight.
Themelis, George. (2021). Controller for a microscope, a corresponding method and a microscope system (U.S. Patent No. 10962759). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10962759
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile