The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Apr. 02, 2020
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Daniel Shaffer, Mountain View, CA (US);

Dirk Holz, Mountain View, CA (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 17/06 (2006.01); G01B 11/00 (2006.01); G05D 1/02 (2020.01); G01S 17/04 (2020.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01B 11/002 (2013.01); G01S 17/04 (2020.01); G01S 17/06 (2013.01); G05D 1/0236 (2013.01); G05D 1/0244 (2013.01); G05D 2201/0216 (2013.01);
Abstract

Methods and systems for detecting sensor orientation characteristics using marker-based localization are disclosed herein. In one aspect, a robotic device can: receive a map of a horizontal marker plane that includes mapped positions of a first marker and a second marker arranged in the horizontal marker plane; receive, from a sensor configured to scan a two-dimensional sensor plane, sensor data indicative of positions of the first and second markers relative to the sensor; determine measured positions of the first and second markers based on the sensor data and a current position of the sensor; determine a difference vector between a first vector that connects the mapped positions of the first and second markers and a second vector that connects the measured positions of the first and second markers; and determine, based on the difference vector, an orientation of the two-dimensional sensor plane relative to the horizontal marker plane.


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