The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Mar. 29, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Fumiya Nehashi, Tokyo, JP;
Toshiharu Suzuki, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
Maintenance time for an automated analysis device is reduced by executing a plurality of maintenance items in parallel. An automated analysis systemis provided with an automated analysis deviceand a terminal device. The automated analysis systemmeasures a sample. The terminal deviceincludes a display unit, an operation unit, and a control unit provided in a computer. The display unitdisplays maintenance items for maintaining the automated analysis device. The operation unitselects one or more of the maintenance items displayed on the display unit. The control unit controls the automated analysis deviceto execute in parallel all the maintenance items selected by the operation unit