The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Oct. 03, 2018
Applicant:

Innotech Alberta Inc., Edmonton, CA;

Inventors:

Stuart Garth Schroeder, Sherwood Park, CA;

Wade Joseph Hagman, Spruce Grove, CA;

Assignee:

InnoTech Alberta Inc., Edmonton, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/67 (2006.01); G01N 27/62 (2021.01); H05H 1/48 (2006.01); G01N 33/50 (2006.01); G01N 21/69 (2006.01);
U.S. Cl.
CPC ...
G01N 21/67 (2013.01); G01N 21/69 (2013.01); G01N 27/62 (2013.01); G01N 33/50 (2013.01); H05H 1/48 (2013.01);
Abstract

A device and method to reduce molecular background emission and to increase matrix management in solution cathode glow discharge (SCGD). A purging device for purging atmospheric gases from a solution cathode glow discharge (SCGD) apparatus, comprising a hollow body that encloses a plasma generated between a solid anode and a solution cathode, wherein the body comprises at least one opening for release of water vapor generated by the plasma. A method for reducing matrix interferences from a SCGD comprising introducing an internal standard into a sample to be analyzed, wherein the sample comprises at least one element of interest; determining a spatial emission profile of the internal standard; using linear correlation between the spatial emission profile of the internal standard and the element of interest to predict a crossover point; and using the crossover point of the element of interest to select a vertical acquisition height for SCGD analysis.


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