The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Apr. 09, 2019
Applicant:

Carl Zeiss Optotechnik Gmbh, Neubeuern, DE;

Inventors:

Junli Sun, Munich, DE;

Xu Sun, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/02 (2006.01); G01B 11/16 (2006.01); G01M 17/02 (2006.01);
U.S. Cl.
CPC ...
G01J 9/0215 (2013.01); G01B 11/162 (2013.01); G01M 17/027 (2013.01);
Abstract

A method for testing a tire by interferometry in a pressure chamber of a tire testing device includes capturing phase images at different pressures in the pressure chamber, generating partial phase difference images between successive phase images, and summing the partial phase difference images to form an overall phase difference image. The pressure in the pressure chamber is changed in a first direction during a first measurement phase and the pressure is changed in the opposite direction during a second measurement phase, wherein at least one partial phase difference image from the first measurement phase and at least one partial phase difference image from the second measurement phase are included in the summation.


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